Real-space interpretation of x-ray-excited Auger-electron diffraction from Cu(001)

Publisher Website
Google Scholar
Abstract
Angle-resolved Auger-electron diffraction from single-crystal Cu(001) surfaces is reported covering the complete range of emission solid angle between inequivalent mirror planes. Contour maps of the Auger-electron polar and azimuthal angular distribution clearly show the relationship of the measured intensity to low-index real-space crystallographic axes. An experimental approach is described which provides a means for surface-sensitive structure determinations in x-ray-excited electron spectroscopy by comparison to the direct lattice using geometrical constructions.