Trace Analysis by Means of the Graphite Spark
- 1 January 1958
- book chapter
- Published by ASTM International
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Determination of Traces of Boron in SiliconAnalytical Chemistry, 1957
- Determination of Traces of Certain Rare Earths in Zirconium ION Exchange Separation and Spectrographic Determination of Fractional Part-Per-Million AmountsAnalytical Chemistry, 1955
- Determination of Traces of Boron in Silicon, Germanium, and Germanium DioxideAnalytical Chemistry, 1955
- Midwest Regional MeetingAnalytical Chemistry, 1954
- Determination of Impurities in Germanium and SiliconAnalytical Chemistry, 1953
- Spectrochemical Analysis by the Copper Spark Method*Journal of the Optical Society of America, 1947