Argon ion induced X-ray analysis of silicon and chlorine in cadmium telluride
- 1 September 1980
- journal article
- Published by Springer Nature in Journal of Radioanalytical and Nuclear Chemistry
- Vol. 55 (2) , 339-344
- https://doi.org/10.1007/bf02514419
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Surface analysis by argon ion induced X-ray fluorescenceNuclear Instruments and Methods, 1978
- Purification of CdTe from, tellurium-rich solutionsJournal of Electronic Materials, 1974
- Cadmium telluride, grown from tellurium solution, as a material for nuclear radiation detectorsPhysica Status Solidi (a), 1970