Study of the Amorphous-to-Microcrystalline Transition during Silicon Film Growth at Increased Rates: Extensions of the Evolutionary Phase Diagram
- 1 January 2000
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Evolutionary phase diagrams for plasma-enhanced chemical vapor deposition of silicon thin films from hydrogen-diluted silaneApplied Physics Letters, 1999
- Gas-phase diagnosis and high-rate growth of stable a-Si:HThin Solid Films, 1999
- Local characterization of electronic transport in microcrystalline silicon thin films with submicron resolutionApplied Physics Letters, 1999
- Optimization of hydrogenated amorphous silicon p–i–n solar cells with two-step i layers guided by real-time spectroscopic ellipsometryApplied Physics Letters, 1998
- Advances in multichannel spectroscopic ellipsometryThin Solid Films, 1998
- Effect of hydrogen dilution on the structure of amorphous silicon alloysApplied Physics Letters, 1997
- Process-Property Relationships For a-Si1-xCx:H Deposition: Excursions in Parameter Space Guided by Real Time SpectroellipsometryMRS Proceedings, 1994
- Defect formation during growth of hydrogenated amorphous siliconPhysical Review B, 1993
- Thin-film coalescence in hydrogenated amorphous silicon probed by spectroscopic ellipsometry with millisecond-scale resolutionPhysical Review Letters, 1992
- Guiding principle for preparing highly photosensitive Si-based amorphous alloysJournal of Non-Crystalline Solids, 1987