Bias-variance trade-offs analysis using uniform CR bound for images

17 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

Vol. 2, 835-839 vol.2
https://doi.org/10.1109/icip.1994.413688

Abstract

We apply a uniform Cramer-Rao (CR) bound to study the bias-variance trade-offs in parameter estimation. The uniform CR bound is used to specify achievable and unachievable regions in the bias-variance trade-off plane. The applications considered are: (1) two-dimensional single photon emission computed tomography (SPECT) system, and (2) one dimensional edge localization.<>

Keywords

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