X-ray topographic studies and measurement of lattice parameter differences within synthetic diamonds grown by the reconstitution technique
- 1 October 1991
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 114 (1-2) , 209-227
- https://doi.org/10.1016/0022-0248(91)90695-2
Abstract
No abstract availableKeywords
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