Dual-energy technique for rapid, high-sensitivity PIXE analysis of aerosol samples covering elements with atomic numbers down to Z = 13
- 1 April 1996
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 109-110, 498-501
- https://doi.org/10.1016/0168-583x(95)00958-2
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Wet deposition of aerosol: test of the methodJournal of Aerosol Science, 1989
- Proton induced X-ray emission as a tool for trace element analysisNuclear Instruments and Methods, 1974