Low energy ion beam mixing of metal-copper multilayers
- 1 March 1989
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 39 (1-4) , 153-157
- https://doi.org/10.1016/0168-583x(89)90760-x
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
- Study of ion beam induced mixing during sputter depth profiling of thin films by LEISNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- Role of thermal spikes in energetic displacement cascadesPhysical Review Letters, 1987
- Sputter depth profiling of thin films with LEIS and LENRSApplied Surface Science, 1987
- Influence of thermochemical properties on ion mixing of markers in Cu and β-Zr at 77 K with KrNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- Ion mixing and thermochemical properties of markers in CuApplied Physics A, 1986
- Fundamental aspects of ion beam mixingNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
- Ion-beam mixing in pure and in immiscible copper bilayer systemsApplied Physics A, 1986
- Ion beam mixing: Basic experimentsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
- Ion mixing and recoil implantation simulations by means of tridynNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
- Influences of thermal spikes in ion beam mixingNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985