Phase Discrimination Using Scanning Electron Microscopy Techniques
- 1 May 1972
- journal article
- research article
- Published by SAGE Publications in Journal of Dental Research
- Vol. 51 (3) , 789-794
- https://doi.org/10.1177/00220345720510031501
Abstract
Polished, unetched amalgam surfaces were studied metallographically with a scanning electron microscope (SEM). By use of different modes of SEM operation, micrographs were obtained from variations in the electric properties of the respective phases present. This technique minimizes artifact formation that may result from conventional electric or chemical etching techniques.Keywords
This publication has 4 references indexed in Scilit:
- Microanalysis of Copper-Tin Phases in Dental AmalgamJournal of Dental Research, 1969
- Microstructure of Dental AmalgamJournal of Dental Research, 1965
- The microstructure of dental amalgam*Australian Dental Journal, 1965
- The Mechanism of Marginal Fracture of Amalgam FillingsActa Odontologica Scandinavica, 1965