EDS and EELS using a TEM-FEG microscope

• 1 April 1995
• journal article
• Published by Elsevier in Ultramicroscopy
• Vol. 58  (1) , 35-41
• https://doi.org/10.1016/0304-3991(94)00176-n

Abstract

Keywords

• CHEMICAL MODIFICATION
• ELECTRON ENERGY LOSS SPECTROSCOPY
• MICROSTRUCTURES
• GRAIN SIZE
• CCD CAMERA