Scanning tunneling microscopy of fullerenes on metal and semiconductor surfaces
- 31 March 1997
- journal article
- Published by Uspekhi Fizicheskikh Nauk (UFN) Journal in Physics-Uspekhi
- Vol. 40 (3) , 275-290
- https://doi.org/10.1070/pu1997v040n03abeh000213
Abstract
No abstract availableThis publication has 88 references indexed in Scilit:
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