Thermal noise in double-injection space-charge-limited solid-state diodes
- 22 January 1970
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 6 (2) , 45-46
- https://doi.org/10.1049/el:19700029
Abstract
It is shown that at frequencies ω≫1/τ, where τ is the lifetime of the carriers, the noise in double-injection space-charge- limited solid-state diodes corresponds approximately to thermal noise of the h.f. conductance g=Iα/ Vα.Keywords
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