Ultimate resolution and information in electron microscopy: general principles
- 2 November 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 47 (1-3) , 266-281
- https://doi.org/10.1016/0304-3991(92)90202-u
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- CBED and CBIM from semiconductors and superconductorsUltramicroscopy, 1988
- Beugung im inhomogenen Primärstrahlwellenfeld. III. Amplituden- und Phasenbestimmung bei unperiodischen ObjektenActa Crystallographica Section A, 1969
- Beugung im inhomogenen Primärstrahlwellenfeld. I. Prinzip einer Phasenmessung von ElektronenbeungungsinterferenzenActa Crystallographica Section A, 1969
- Beugung in inhomogenen Primärstrahlenwellenfeld. II. Lichtoptische Analogieversuche zur Phasenmessung von GitterinterferenzenActa Crystallographica Section A, 1969
- Information Theory and Optical ImagesJournal of the Optical Society of America, 1955
- Communication in the Presence of NoiseProceedings of the IRE, 1949
- V. Investigations in optics, with special reference to the spectroscopeJournal of Computers in Education, 1880
- LVI. Investigations in optics, with special reference to the spectroscopeJournal of Computers in Education, 1879
- XLVI. Investigations in optics, with special reference to the spectroscopeJournal of Computers in Education, 1879
- XXXI. Investigations in optics, with special reference to the spectroscopeJournal of Computers in Education, 1879