Electron microscopy of grey tin
- 1 January 1986
- journal article
- research article
- Published by Springer Nature in Journal of Materials Science Letters
- Vol. 5 (1) , 103-104
- https://doi.org/10.1007/bf01671454
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- The effect of pressure on the semiconductor-to-metal transition temperature in tin and in dilute Sn–Ge alloysJournal of Applied Physics, 1984
- The growth of metastable, heteroepitaxial films of α-Sn by metal beam epitaxyJournal of Crystal Growth, 1981
- Electron-microscopic evidence of transformation-induced lattice defects in grey tinJournal of Materials Science, 1973