Surface oxidation as a diffusion barrier for Al deposited on ferromagnetic metals
- 16 April 2001
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 89 (9) , 5209-5214
- https://doi.org/10.1063/1.1359151
Abstract
Grazing incidence x-ray reflectometry has been used to study surface oxidation as a diffusion barrier for Al deposited on ferromagnetic metals (Co, Fe, Ni, and Samples of the form with were investigated for X\Al intermixing. Surface oxidation was achieved by exposing the ferromagnetic layer to to oxidize the top two or three atomic layers before depositing the Al layer. Specular x-ray scans were used for the analysis. Samples of the form were used to separate topographical roughness from intermixing. Surface oxidation was found to suppress the diffusion of Al into Co, Ni, and but not into Fe.
This publication has 22 references indexed in Scilit:
- Magnetoresistance in doped magnetic tunnel junctions: Effect of spin scattering and impurity-assisted transportPhysical Review B, 2000
- Interface structures and magnetoresistance in magnetic tunnel junctionsJournal of Applied Physics, 1999
- Crystallographic texture and interface structure in Co/Cu multilayer filmsPhysical Review B, 1998
- High resolution x-ray diffraction and scattering measurement of the interfacial structure of ZnTe/GaSb epilayersJournal of Applied Physics, 1997
- Kinetic Role of a Surfactant in Island FormationPhysical Review Letters, 1996
- Indium-induced layer-by-layer growth and suppression of twin formation in the homoepitaxial growth of Cu(111)Physical Review B, 1995
- Island Shape-Induced Transition from 2D to 3D Growth for Pt/Pt(111)Physical Review Letters, 1995
- Surfactant-Induced Layer-by-Layer Growth of Ag on Ag(111): Origins and Side EffectsPhysical Review Letters, 1994
- Origin of oxygen induced layer-by-layer growth in homoepitaxy on Pt(111)Physical Review Letters, 1994
- Epitaxial fcc Fe Films on Cu(100)Physical Review Letters, 1988