Bridging the gap between design and testing of analog integrated circuits

Publisher Website

4 December 2002

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/iscas.1990.112570

Abstract

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Keywords

This publication has 2 references indexed in Scilit:

Bridging the gap between design and testing of analog integrated circuits
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
Full-speed testing of A/D converters
IEEE Journal of Solid-State Circuits, 1984