Ellipsometer for Use with LEED Chamber
- 1 October 1968
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 39 (10) , 1593-1594
- https://doi.org/10.1063/1.1683181
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Ellipsometry, low-energy electron diffraction and field electron microscopy combinedSurface Science, 1968