An automatic system for X-ray diffraction line profile analysis
- 1 August 1978
- journal article
- Published by Springer Nature in Journal of Materials Science
- Vol. 13 (8) , 1717-1724
- https://doi.org/10.1007/bf00548735
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The Separation of Cold-Work Distortion and Particle Size Broadening in X-Ray PatternsJournal of Applied Physics, 1952
- The Effect of Cold-Work Distortion on X-Ray PatternsJournal of Applied Physics, 1950
- A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-ray Powder PhotographsProceedings of the Physical Society, 1948
- A Correction for the 1 2Doublet in the Measurement of Widths of X-ray Diffraction LinesJournal of Scientific Instruments, 1948