Non-local screened-exchange calculations for defects in semiconductors: vacancy in silicon
- 13 June 2003
- journal article
- Published by IOP Publishing in Journal of Physics: Condensed Matter
- Vol. 15 (25) , 4387-4395
- https://doi.org/10.1088/0953-8984/15/25/309
Abstract
No abstract availableKeywords
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