Offset of the electrical characteristics of alternating-current thin-film electroluminescent devices

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Abstract
Article appears in Applied Physics Letters (http://apl.aip.org/) and is copyrighted by American Institute of Physics (http://www.aip.org/).Offset is observed in the charge–voltage (Q–V) or internal charge–phosphor field (Q–Fp)\ud characteristics of certain alternating-current thin-film electroluminescent (ACTFEL) devices. This\ud offset arises from a displacement along the voltage axis of a transient curve measured across a sense\ud capacitor in the electrical characterization setup. A procedure for adjusting this offset is proposed\ud that allows ACTFEL devices manifesting offset to be meaningfully analyzed. Two possible sources\ud of offset are deduced from simulation and are associated with an asymmetry in the interface state\ud energy depths at the two phosphor–insulator interfaces or with an asymmetry in the location of\ud space charge generation in the phosphor

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