Quantitative trace element imaging using PIXE and the nuclear microprobe
Top Cited Papers
- 1 January 2000
- journal article
- research article
- Published by Wiley in International Journal of Imaging Systems and Technology
- Vol. 11 (4) , 219-230
- https://doi.org/10.1002/ima.1007
Abstract
The X‐ray spectra of pure elements, excited using MeV energy beam of protons from the nuclear microprobe, have known spectra signatures. This makes X‐ray spectra for more complex mixtures amenable to decomposition into contributions from the component elements. By devising this procedure as a matrix operation that transforms directly from spectrum vector to elemental concentration vector, the decomposition can be performed very efficiently enabling the real‐time projection of the component element signals. In the case of a raster‐scanned beam, with data that contain position information for each X‐ray event, this approach enables the real‐time projection of component element spatial distribution images. This paper describes the matrix transform approach called dynamic analysis (DA), which enables on‐line real‐time imaging of major and trace elements using proton‐induced X‐ray emission (PIXE). The method also provides off‐line iterative yield corrections to these images to compensate for changing sample composition across an image area. The resulting images are quantitative in two respects: (1) they resolve the pure element components and strongly reject interferences from other elements and (2) they can be directly interrogated for sample composition at each pixel, over areas, or along lines across the image area, with accuracy comparable to microanalytical point analysis methods. The paper describes the DA method, presents tests, and discusses its application to quantitative major and trace element imaging in geology. © 2001 John Wiley & Sons, Inc. Int J Imaging Syst Technol 11, 219–230, 2000Keywords
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