Phase Transformations in Eutectic Gold-Silicon Alloys on Single-Crystal Silicon

Abstract
Phase transformations in eutectic gold‐silicon alloy thin films on single‐crystal silicon substrates have been studied as a function of the rate of cooling from the melt by utilizing metallography, resistivity measurements, and x‐ray and electron diffraction. Cooling at rates 103 °C/sec the eutectic transformation is suppressed, and metastable structures are obtained. Isothermal annealing studies show that the reversion of the metastable structures on heating occurs via a series of both diffusionless and diffusion‐controlled transformations.

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