Wafer-scale integration of systolic arrays

Abstract
This paper describes and analyzes several algorithms for constructing systolic array networks from cells on a silicon wafer. Some of the cells may be defective, and thus the networks must be configured to avoid them. We adopt a probabilistic model of cell failure, and attempt to construct networks whose maximum wire length is minimal Although the algorithms presented are designed principally for application to the wafer-scale integration of one and two-dimensional systolic arrays, they can also be used to construct networks in well studied models of geometric complexity. Some of the algorithms are of considerable practical interest.

This publication has 16 references indexed in Scilit: