Photovoltaic Module Reliability Improvement through Application Testing and Failure Analysis
- 1 August 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-31 (3) , 228-234
- https://doi.org/10.1109/tr.1982.5221325
Abstract
Field experience obtained through photovoltaic test and application experiments sponsored by the US Department of Energy has offered an opportunity for solar cell module reliability assessment and improvement. Through a formal problem/failure reporting and analysis system, field problems have been identified and characterized. The causes of field failures have been analyzed with respect to environmental and operational stresses and to induced degradation mechanisms. On the basis of these results, manufacturers have improved the reliability of later generations of modules through changes in design, material selection, and manufacturing controls. This paper summarizes field experience, describes key failure modes, and evaluates industry progress in addressing such problems.Keywords
This publication has 3 references indexed in Scilit:
- Photovoltaic Module Reliability Improvement through Application Testing and Failure AnalysisIEEE Transactions on Reliability, 1982
- Qualification Testing of Flat-Plate Photovoltaic ModulesIEEE Transactions on Reliability, 1982
- LSA feld test annual report, August 1979-August 1980Published by Office of Scientific and Technical Information (OSTI) ,1980