High voltage scanning electron microscopy for observing magnetic domains
- 21 June 1975
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 8 (9) , L113-L114
- https://doi.org/10.1088/0022-3727/8/9/001
Abstract
A high voltage scanning electron microscope was used to observe the magnetic domains of an iron-3% silicon polycrystal sheet. The increased accelerating voltage results in the enhancement of magnetic contrast, the moderation of topographical contrast caused by the surface projections and the reduction of electron channelling contrast, thereby making it possible to observe the domain structure with great ease.Keywords
This publication has 5 references indexed in Scilit:
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