Laser Measurement Techniques - Laser Spectroscopy In Semiconductors

• 20 November 1985
• proceedings article
• Published by SPIE-Intl Soc Optical Eng
• Vol. 0540, 362
• https://doi.org/10.1117/12.976138

Abstract

Keywords

• SEMICONDUCTORS
• EXCITONS
• OXYGEN
• ZINC
• LUMINESCENCE
• DATA ACQUISITION
• COMPOUND SEMICONDUCTORS
• LASER SPECTROSCOPY
• DATA ACQUISITION SYSTEM
• SYSTEM PERFORMANCE
• LASERS