Anomalous Electrical Resistivity and Defects inCompounds
- 6 September 1976
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 37 (10) , 637-638
- https://doi.org/10.1103/physrevlett.37.637
Abstract
Measurements of the temperature dependence of the electrical resistivity and correlations observed with for Si, Ge, and Nb-Ge show (i) the existence of a universal defect in the superconductors which is not nonstoichiometry, (ii) a normal state anomaly also strongly influenced by the defects, and (iii) evidence that and the electron-phonon interactions for transport processes are ∼ 100 times more sensitive to defectproducing sample modifications in the compounds than in Nb.
Keywords
This publication has 4 references indexed in Scilit:
- Correlations between the Transition Temperature ofGe and the Normal-State ResistivityPhysical Review Letters, 1976
- -Induced Damage in Superconducting Nb-Ge FilmsPhysical Review Letters, 1975
- Superconducting critical current of sputtered Nb-Ge filmsSolid State Communications, 1975
- Preparation and analysis of superconducting Nb-Ge filmsPhysical Review B, 1975