Use Of Electronic Speckle Pattern Interferometry (ESPI) In The Measurement Of Static And Dynamic Surface Displacements

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Abstract
Electronic speckle pattern interferometry (ESPI) enables static and dynamic surface displacements to be measured in real time to an accuracy of the order of a wavelength of light. The principles of the technique are outlined and the different configurations of interferometers described. Some applications of the technique are discussed.

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