Local Texture Measurements by EBSP. New Computer Procedures

Open Access

1 January 1991

journal article
research article
Published by Wiley in Texture, Stress, and Microstructure

Vol. 14 (1) , 97-102
https://doi.org/10.1155/tsm.14-18.97

Abstract

Two new computer procedures for analysis of electron back scattering patterns (EBSP) are presented. One is a semiautomatic procedure for on‐line analysis of EBSPs. The other is an image processing procedure for computer identification of bands in an EBSP. These two procedures may be combined for fully automatic indexing of EBSPs.

Keywords

TEXTURE MEASUREMENTS
EBSP
IMAGE PROCESSING
PROCESSING PROCEDURE
SCATTERING
LOCAL TEXTURE
NEW COMPUTER PROCEDURES

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