SPICE MODEL FOR TRANSIENT ANALYSIS OF EEPROM CELLS

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Abstract
An equivalent model for the EEPROM cell, described on a SPICE circuit analyzer, is used for the transient analysis of erase(E)/write(W) characteristics with ramp waveform programming pulses. The results of the simulation are compared with the experimental data obtained by an innovative method for measuring E/W curves. The validation of the model is made over different variations of the cell lay-out, different programming voltages and different rise times for the ramp of the programming pulse

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