A new method for first order line interference correction in X‐ray spectrochemical analysis. Application to the analysis of geological samples
- 1 July 1974
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 3 (3) , 130-132
- https://doi.org/10.1002/xrs.1300030309
Abstract
A mathematical procedure used for correcting the interference between two nearest first order overlapping lines is described. The intensity of the ‘composite’ peak is assumed to be a linear superposition of the individual components; the shift in angular position of the sample. The proposed method is based on the dependence existing between the different parameters involved, which can be represented by a mathematical relationship of the [Ri]=[kij] [Cj], where Ri is the observed intensity, measured at the theoretical 2θ values for the elements involved, Kji are characteristic constants of the angular position and Cj the concentration of the elements.Keywords
This publication has 3 references indexed in Scilit:
- U.S. Geological survey standards—I. Additional data on rocks G-1 and W-1, 1965–1967Geochimica et Cosmochimica Acta, 1969
- U.S. Geological Survey standards—II. First compilation of data for the new U.S.G.S. rocksGeochimica et Cosmochimica Acta, 1969
- Line interference corrections for X-ray spectrographic determination of vanadium, chromium and manganese in low-alloy steelsSpectrochimica Acta, 1960