Progress in the analysis of crystalline solids
- 1 April 1980
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 48 (4) , 666-682
- https://doi.org/10.1016/0022-0248(80)90277-8
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Interface studies of AlxGa1−xAs-GaAs heterojunctionsJournal of Applied Physics, 1979
- Secondary ion mass spectrometry at close to single‐atom concentration using DC acceleratorsSurface and Interface Analysis, 1979
- The rotating sample technique for measurement of random backscattering yields from crystals and its application to β-aluminaNuclear Instruments and Methods, 1978
- Concentrations of carbon and oxygen in indium phosphide and gallium arsenide crystals grown by the lec techniqueJournal of Electronic Materials, 1976
- The computer evaluation and interpretation of photographically recorded spark source mass spectraInternational Journal of Mass Spectrometry and Ion Physics, 1974
- Ion microprobe analysers. History and outlookAnalytical Chemistry, 1974
- Determination of oxygen in semiconductor materials with a cryogenically pumped spark-source mass spectrometerThe Analyst, 1973
- Secondary ion mass analysis, Technique for three-dimensional characterizationAnalytical Chemistry, 1972
- Direct analysis of thin layers of spark source mass spectrographyAnalytical Chemistry, 1970
- Mass spectrometric studies of impurities in gallium arsenide crystalsJournal of Materials Science, 1967