Emission of secondary particles from metals and insulators at impact of slow highly charged ions
- 1 April 1997
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 125 (1-4) , 153-158
- https://doi.org/10.1016/s0168-583x(96)00930-5
Abstract
No abstract availableKeywords
This publication has 32 references indexed in Scilit:
- Energy spectrum of a 2D Dirac electron in the presence of a constant magnetic fieldZeitschrift für Physik B Condensed Matter, 2001
- Investigations of the interactions of highest charge state ions with surfacesPhysica Scripta, 1996
- Collisional versus electronic sputtering of SiO2Journal of Applied Physics, 1994
- Electron emission from ion-bombardedthin filmsPhysical Review B, 1994
- The dependence of Si and SiO2 electron emission on the angle of ion incidenceJournal of Applied Physics, 1993
- Computer experiments on molecular ejection from an amorphous solid: Comparison to an analytic continuum mechanical modelPhysical Review B, 1992
- Desorption induced by multiple electronic transitionsPhysical Review Letters, 1992
- Observation of high electron emission yields following highly charged ion impact (up to) on surfacesPhysical Review Letters, 1992
- Fast heavy ion induced desorptionRadiation Effects and Defects in Solids, 1989
- Secondary ion emission induced by multicharged 18-keV ion bombardment of solid targetsPhysical Review Letters, 1988