A fast high-accuracy lattice-parameter comparator

• 1 February 1990
• journal article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 23  (1) , 63-69
• https://doi.org/10.1107/s0021889889011623

Abstract

Keywords

• SILICON
• LATTICE SPACINGS
• SPRINGS
• COPPER
• CRYSTALS
• RADIATION
• MONOLITHIC CRYSTAL
• AXIS ARRANGEMENT
• DOUBLE LEAF