Electrostatic modeling and ESD damage of magnetoresistive sensors

• 1 January 1996
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
• Vol. 32  (1) , 49-53
• https://doi.org/10.1109/20.477549

Abstract

Keywords

• SENSOR
• MAGNETORESISTIVE
• CIRCUIT SIMULATIONS
• BURNOUT
• ELECTROSTATIC
• THERMAL MODEL
• THIN FILM
• MODELING AND ESD