Electron microscope study of the Ti 4 O 7 phase in an annealed titanium oxide evaporated film
- 1 July 1981
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine A
- Vol. 44 (1) , 73-90
- https://doi.org/10.1080/01418618108244495
Abstract
Interpretable images of the structure of Ti4O7 have been obtained with a high-voltage electron microscope at a resolution of approximately 4·5 Å. The Ti4O7 phase including defects was observed to grow quickly in an evaporated film made from TiO17middot;0 during in situ annealing and oxidation in the electron microscope. The basis for interpretation of the images is first investigated using a computer-simulation technique. Then, it is possible to analyse three different types of defect which occur within the Ti4O7 phase, i.e. coherent twin boundaries having (104) composition planes, coherent intergrowth of Ti n O2n−1 (n = 5, 6) parallel to the (002) plane of Ti4O7 and a new, possibly metastable, type of Ti5O9 structure which forms coherent boundaries parallel to the (102) plane of Ti4O7.Keywords
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