A note on the increase in usable foil thickness in scanning transmission electron microscopy
- 1 January 1975
- journal article
- other
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 31 (1) , 225-228
- https://doi.org/10.1080/14786437508229298
Abstract
A change from conventional transmission electron microscopy to scanning transmission electron microscopy (STEM) does not increase the usable foil thickness of gold, the dominant inelastic scattering mechanism being phonon excitation. If the expected improvements for light-element materials in the STEM mode transpire, then for increased usable foil thickness, high-voltage electron microscopy and STEM will form complementary techniques with respect to specimen atomic weight.Keywords
This publication has 3 references indexed in Scilit:
- Maximizing the penetration in high voltage electron microscopyPhilosophical Magazine, 1971
- Preservation of electron microscope image contrast after inelastic scatteringPhilosophical Magazine, 1969
- The Observation of Thick Specimens by High Voltage Electron Microscopy. Experiment with Molybdenite Films at 50-500 kVJapanese Journal of Applied Physics, 1967