X-ray double-crystal analysis of misorientation and strain in GaAs/Si and related heterostructures
- 1 February 1993
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 73 (3) , 1154-1160
- https://doi.org/10.1063/1.353282
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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