A Measurement Method for Accurate Characterization and Modeling of MESFET Chips

23 March 2005

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

Vol. 81 (0149645X) , 310-312
https://doi.org/10.1109/mwsym.1981.1129908

Abstract

A straightforward measurement procedure based on a deembedding method and FET unbiased drain RF measurements is presented that produces accurate chip MESFET characteristics. Usefulness of the data is shown by inexpensively obtained MESFET model parameters.

Keywords

SEMICONDUCTOR DEVICE MEASUREMENT
MESFETS
JOINING PROCESSES
CIRCUITS
BONDING
FETS
ELECTRICAL RESISTANCE MEASUREMENT
FREQUENCY MEASUREMENT
VARACTORS
WIRE

This publication has 1 reference indexed in Scilit:

De-Embedding and Unterminating
IEEE Transactions on Microwave Theory and Techniques, 1974