Identification of epitaxial Y2O3 inclusions in sputtered YBa2Cu3O7 films: Impact on film growth
- 24 February 1992
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 60 (8) , 1016-1018
- https://doi.org/10.1063/1.106507
Abstract
Y2O3 inclusions with typical sizes between 100 and 300 nm3, densely distributed (1016 cm−3) in sputtered YBa2Cu3O7 (YBCO) films on SrTiO3 substrates, have been identified by high-resolution electron microscopy. The precipitates exhibit either cuboid or needlelike shapes and grow epitaxially within and on top of YBCO. The dominant orientation relationship corresponds to a situation where the two-dimensional lattices are nearly coincident in the interfacial (001) plane. These precipitates may contribute to the generation of screw and edge dislocations. In addition, they provide a large number of potential pinning sites for magnetic flux lines, which may contribute to the observed high critical current densities.Keywords
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