Preparation and characterization of alumina films by sol-gel method
- 31 March 1986
- journal article
- Published by Elsevier in Materials Research Bulletin
- Vol. 21 (3) , 301-306
- https://doi.org/10.1016/0025-5408(86)90186-8
Abstract
No abstract availableKeywords
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- InP metal/oxide/semiconductor devices incorporating Al2O3 dielectrics chemically vapour deposited at low pressureThin Solid Films, 1982
- Investigations of porous oxides as an antireflective coating for glass surfacesApplied Optics, 1980