Tunneling barrier structure of and thin film Josephson junctions studied by Auger electron spectroscopy and X-ray photoelectron spectroscopy analysis
- 1 August 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 94 (4) , 331-339
- https://doi.org/10.1016/0040-6090(82)90494-1
Abstract
No abstract availableKeywords
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