Preparation of transmission electron microscope specimens from FeAl and WC powders using focused-ion beam milling
- 30 April 2001
- journal article
- Published by Elsevier in Materials Characterization
- Vol. 46 (4) , 297-304
- https://doi.org/10.1016/s1044-5803(00)00107-8
Abstract
No abstract availableKeywords
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