New applications and extensions of the unique advantages of HVEM for physical and materials research

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31 December 1978

journal article
Published by Elsevier in Ultramicroscopy

Vol. 3, 3-18
https://doi.org/10.1016/s0304-3991(78)80002-3

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

Report of a workshop on analytical electron microscopy held at Cornell University, Ithaca, New York, USA, August 3–6, 1976
Ultramicroscopy, 1977