Various TEM methods for the study of metal matrix composites
- 2 August 1988
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 151 (2) , 159-169
- https://doi.org/10.1111/j.1365-2818.1988.tb04622.x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- A TEM fresnel diffraction-based method for characterizing thin grain-boundary and interfacial filmsPhilosophical Magazine A, 1986
- A failure mechanism in AlSiC compositesScripta Metallurgica, 1986
- Non-equilibrium phase distribution in an Al-SiC compositeMaterials Science and Engineering, 1985
- Specimen preparation methods for the examination of surfaces and interfaces in the transmission electron microscopeJournal of Microscopy, 1985