XPS and UPS investigation of PF6 doped and undoped poly 3-methyl thiophene

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Abstract
XPS and UPS techniques have been used to characterize electrochemically grown conductive films using two different solvent systems of poly (3‐methyl thiophene) in the PF6 doped and undoped states. Core‐level and valence‐level spectra have yielded information on the nature of the polymeric cation and its associated PF6 anion as well as structural disorder effects in these polymers. Results have revealed that addition of the PF6 anion causes structural disorder within the polymer and that the PF6 anion interacts with the highest occupied nonbonding lone pair orbital. Solvent system effects are also evident.