Novel fabrication tolerant flat-top demultiplexers based on etched diffraction gratings in SOI
- 1 September 2008
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
Flat-top demultiplexers using etched diffraction gratings in the silicon-on-insulator (SOI) platform are reported and experimentally demonstrated. The novel design enables the loss and crosstalk of the devices to be insensitive to the vertical angle of the grating facets.Keywords
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