Locally enhanced Raman spectroscopy with an atomic force microscope
Top Cited Papers
- 22 May 2000
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 76 (21) , 3130-3132
- https://doi.org/10.1063/1.126546
Abstract
An atomic force microscope (AFM) tip has been used to selectively produce surface enhanced Raman scattering (SERS) for localized Raman spectroscopy. Spectra of thin films, undetectable with a Raman microprobe spectrometer alone, were readily acquired in contact with a suitably gold-coated AFM tip. Similarly, an AFM tip was used to remove sample layers at the nanometer scale and subsequently served as a SERS substrate for ultratrace analysis. This work demonstrates the interface of an AFM with a Raman spectrometer that provides increased sensitivity, selectivity, and spatial resolution over a conventional Raman microprobe. An AFM guiding the SERS effect has the potential for targeted single molecule spectroscopy.Keywords
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