Tight-binding investigation of electron tunneling through ultrathin SiO2gate oxides
- 31 May 2000
- journal article
- Published by Elsevier in Superlattices and Microstructures
- Vol. 27 (5-6) , 405-409
- https://doi.org/10.1006/spmi.2000.0850
Abstract
No abstract availableKeywords
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