Microscopic Studies of Radiation Damage-Induced Defects Responsible for the Deterioration of High-Resistivity Silicon Detectors
- 1 July 1997
- journal article
- Published by Trans Tech Publications, Ltd. in Solid State Phenomena
- Vol. 57-58, 233-238
- https://doi.org/10.4028/www.scientific.net/ssp.57-58.233
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: